You are cordially invited to attend a complimentary one day program on the topic “Supply Chain Risks & Rewards in Emerging Markets” on March 15, 2018. The conference will be at the offices of Baker McKenzie located at 815 Connecticut Ave., NW, Washington, DC 20006.
The event will highlight the key legal compliance risks in supply chain relationships, including the growing list of supply chain standards that were once voluntary steps that are now becoming legal obligations. One of the most compelling reasons to attend is to learn the latest trends and best practices in supply chain risk management, and practical tips on integrating supply chain risk management processes to efficiently and effectively protect your people and business. Following lunch, there will be four breakout sessions and we will conclude our program with a cocktail reception. We have recruited leading experts from around the world to identify and unpack relevant supply chain legal risks, anticipate the change and growth in those risks moving forward, and share best practices in mitigating risks in challenging emerging market environments. CLE will be provided.
About this event
Thursday, March 15, 2018 9:00 am – 5:00 pm
Location Baker McKenzie 815 Connecticut Ave, NW Washington, DC 20006
Host Reagan Demas, Partner T + 1 202 835 1886 reagan.demas@bakermckenzie.com
Questions Sal Gonzalez T + 1 202 835 1661 sal.gonzalez@bakermckenzie.com
Agenda
9:00 am | Registration |
9:15 am | Welcome Remarks |
9:30 am | Latest Trends in Supply Chain Management |
10:30 am | Structuring the Supply Chain |
11:30 am | Break |
11:45 am | Best Practices in Risk Management and Dispute Resolution |
12:45 pm | Lunch |
2:00 pm | Breakout Session 1 (select one option) |
Option 1: Anticorruption & AML | |
Option 2: US Import Regulations and Trade Sanctions | |
3:00 pm | Breakout Session 2 (select one option) |
Option 1: Cybersecurity & Data Privacy | |
Option 2: Government Contracting | |
4:00 pm | Diligencing and Monitoring Supply Chain Partners |
5:00 pm | Cocktail Reception |